Workshop on

Applications Practical Aspects, and Case Studies

 of Materials Characterization 

การสัมมนาฯ ภายใต้โครงการถ่ายทอดเทคโนโลยีจากต่างประเทศเพื่อเพิ่มขีดความสามารถในการแข่งขันให้แก่ภาคอุตสาหกรรม

26 – 28 September 2016

Meeting Room : CC Auditorium (Changed), Convention Center (CC), Thailand Science Park , Pathum Thani

 

The characterization techniques will include X-ray diffraction (XRD), X-ray fluorescence (XRF), scanning electron microscopy (SEM), and transmission electron microscopy (TEM). This is a continuation (the second part) of the workshop offered at MTEC and NANOTEC.

 

   Background:   

 

Advancement in nanoscience and nanotechnology depends strongly on our ability to improve existing materials and to invent new ones. Controlling structures and compositions of materials is one of the key aspects of materials science and engineering. X-ray diffraction (XRD) is a critical materials analysis technique using electromagnetic wave X-ray to identify crystallinity, phase structure, particle size, and defects. XRD is the first technique used in characterization of materials because it offers wealth of information about the samples. Scanning electron microscope (SEM) is an indispensable tool for nanotechnology because of the ease of interpretation, rich scientific content, and flexibility. SEM is now a standard part of industrial and academic laboratories and SEM images are common in newspapers, magazines, and movies. The inclusion of an Energy Dispersive X-ray Spectrometer (EDS) based on X-ray fluorescence (XRF) principles, enables elemental identification of the sample at the micrometer scale, as well as elemental mapping/imaging and quantification.

 

Transmission electron microscope (TEM), on the other hand, can provide internal structures of materials at a much higher resolution than SEM. Examples of interesting structures which determine the materials properties include grain boundaries, particles shape and size in nanometer scales, dislocations, inclusions, voids and structure of coating layer, if any. In addition, TEM can simultaneously perform electron diffraction of the sample in micro- or nano-meter range. This will provide capability to identify the phase information whether the sample is amorphous, single crystalline or polycrystalline.

 

MTEC and NANOTEC are fully equipped with many SEM, TEMs, and XRD / XRF for services to research community in the country. Combining instrumentation at MTEC and NANOTEC in Thailand. The workshop will help scientific community and attendees to learn more about advantages and capabilities of TEM / SEM / XRF and be able to produce high-quality data for scientific publications.

 

  Workshop Presenter: 

 

Prof. Dr. Supapan Seraphin [CV] (ATPAC member), University Distinguished Outreach Professor, Department of Materials Science and Engineering with joint appointments in Department of Agriculture Biosystems Engineering in College of Agriculture and Life Sciences, and in College of Optical Sciences, University of Arizona, Tucson, Arizona 85721. 

 

  Local Host / Coordinators:   

  1. Dr. Chanchana Thanachayanont
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    Head of Physical Characterization Laboratory at MTEC

  2. Dr. Uracha Ruktanonchai
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    Deputy Executive Director of NANOTEC

 

   Objectives: 

1.   To provide working knowledge, practical aspects, problem solving skills, and case studies of various materials characterization techniques including XRD, XRF, SEM and TEM.

2.   To provide an opportunity for networking among attendees and a platform for possible future collaboration.

 

  Attendees and Target Audiences: 

The workshop will be opened to public. Researchers, scientists, technical staff, graduate students from MTEC, NANOTEC, other research organizations, various universities, and industry around Thailand. The workshop will be useful for researchers in various fields whose research related to materials and nanomaterials.

 

Format:

There will be two parts of the workshop:

  1. First half of each day: presentation and discussion to update their knowledge on the materials analysis using XRD, XRF, SEM, and TEM. Estimated number of attendees to be 80 people.

  2. Second half of each day- Hands-on and Analysis of their own data:for those who have direct experience in operating the XRD, SEM, TEM, and X-ray spectroscopy or have their own data. Estimated number of attendees to be 20 people. This group of attendees will start with the first-half of the day. Attendees will bring their own data to discuss in the group

 

  Outline of the Workshop: 

September 26, 2016

8:45                  Opening and welcome remark

9:00 –12:00       Review Introduction to XRD, XRF [XRD] [XRF]

13:00 – 16:00       Analysis and interpretation of their own data on XRD, XRF 

  

September 27, 2016

9:00 –12:00       Review Introduction to SEM, low-voltage SEM, variable-pressure SEM [SEM] [FESEM] [Raman]

  • Optimization of beam parameters (electron guns and electron optics)

  • Contrast mechanisms (SE, BSE-topographic and compositional)

  • Energy Dispersive X-ray Spectroscopy -geometry, count rate, qualitative analysis

  • Variable-pressure mode, optimum operating conditions [Variable pressure SEM]

  • Low-voltage SEM

  • Tips on analysis of “difficult” samples

13:00 – 16:00       Analysis and interpretation of their own data on SEM, EDS [EDS] and Raman]

September 28, 2016

9:00 –12:00         Review Introduction to TEM [TEM] [Electron diffraction]

  • Introduction to lenses, apertures, alignment functions

  • Basic and practice three sets of lenses alignment and filament alignment

  • Electron diffraction: selected-area diffraction and convergent-beam mode

  • Bright-field, dark-field imaging (Beam tilt) High-resolution TEM imaging

 13:00 – 16:00       Analysis and interpretation of their own data on TEM, EDS

 

  Benefits:   

The first part of the workshop will provide the review of principles and applications of XRD, XRF, SEM and TEM techniques. The second part of the workshop is designed for researchers who deal directly with these techniques. It aims to enhance the knowledge in interpretation and analysis of real results so they can fully utilize these expensive, complicated instruments. The workshop may also serve as professional networking, which may lead to future collaborations among the attendees. I am confident that this proposed workshop will have positive impacts and high productivity especially the engaging afternoon sessions.

 

  No registration fee   

  

Type no.  Date   Time Maximum capacity
  Type 1   Sep. 26, 2016   9:00 – 12:00 120
  Type 2   Sep. 26, 2016   9:00 – 16:00 60
  Type 3   Sep. 27, 2016   9:00 – 12:00 120
  Type 4   Sep. 27, 2016   9:00 – 16:00 60
  Type 5   Sep. 28, 2016   9:00 – 12:00 120
  Type 6   Sep. 28, 2016   9:00 – 16:00 60

 

 

 

  Registration Confirmation 

The seminar is free of charge. (Limit 300 persons : Now Full !!)

 

Cancellation and Refund Policy

Cancellations later than August 31, 2016 will not receive any refund.

Notification of cancellation must be received in writing to us by e-mail or fax. Only cancellations made in writing are acceptable

 

  Contact   

Mr. Peerapong Pinwanich

Human Resources Development for Materials Science (HMS)

National Metal and Materials Technology Center (MTEC)

114 Thailand Science Park, Paholyothin Rd., Klong 1, Klong Luang, Pathumthani 12120, Thailand

Tel.: +66-2564-6500 ext. 4680  Fax: +66-2564-6505

Email: This email address is being protected from spambots. You need JavaScript enabled to view it.